(513) 556-3220 Email Facility Site

Advanced Materials Characterization Center (AMCC)

Melodie Fickenscher

The Advanced Materials Characterization Center is a research facility located in the College of Engineering at the University of Cincinnati. The AMCC provides access to electron microscopes, x-ray diffraction, and a variety of other analytical instrumentation. Training and sample evaluation is available to researchers within the UC community, as well as external universities and companies.

(513) 556-3220 Email Facility Site
Services0
Equipment8

  • Scanning Electron Microscope (FEI Aprio LV-SEM)

    Scanning Electron Microscope (FEI Aprio LV-SEM)

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  • Transmission Electron Microscope (FEI CM20 TEM)

    Transmission Electron Microscope (FEI CM20 TEM)

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  • Atomic Force Microscope (AFM)

    Atomic Force Microscope (AFM)

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  • X-Ray Diffraction (X'Pert)

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  • Differential Scanning Calorimeter (DSC)

    Differential Scanning Calorimeter (DSC)

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  • Thermogravimetric Analyzer (TGA)

    Thermogravimetric Analyzer (TGA)

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  • Dynamic Light Scattering

    Dynamic Light Scattering

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  • SEM/Focused Ion Beam (FEI SCIOS)

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